US 6,982,580 B2
Speed-locked loop to provide speed information based on die operating conditions
Mel Bazes, Haifa (Israel)
Assigned to Intel Corporation, Santa Clara, Calif. (US)
Filed on Jun. 06, 2003, as Appl. No. 10/456,030.
Application 10/456030 is a continuation of application No. 09/550452, filed on Apr. 17, 2000, granted, now 6,633,186.
Prior Publication US 2003/0210083 A1, Nov. 13, 2003
This patent is subject to a terminal disclaimer.
Int. Cl. H03L 7/06 (2006.01)
U.S. Cl. 327—159 12 Claims
OG exemplary drawing
 
1. A die having an operating condition, the die comprising:
an output bus; and
a speed-locked loop to provide on the output bus a value indicative of the operating condition, the speed-locked loop comprising:
an oscillator having a frequency;
a counter to count cycles of the oscillator occurring throughout a counting time interval to provide a counter value indicative of the oscillator frequency;
an input bus having a set of voltages representing an input bus value;
a comparator to compare the counter value to the input bus value; and
a control functional unit to decrease the oscillator frequency if the counter and input bus values satisfy a first relationship and to increase the oscillator frequency if the counter and input bus values satisfy a second relationship,
wherein the set of voltages on the input bus is static during the counting time interval.