US 6,982,580 B2 | ||
Speed-locked loop to provide speed information based on die operating conditions | ||
Mel Bazes, Haifa (Israel) | ||
Assigned to Intel Corporation, Santa Clara, Calif. (US) | ||
Filed on Jun. 06, 2003, as Appl. No. 10/456,030. | ||
Application 10/456030 is a continuation of application No. 09/550452, filed on Apr. 17, 2000, granted, now 6,633,186. | ||
Prior Publication US 2003/0210083 A1, Nov. 13, 2003 | ||
This patent is subject to a terminal disclaimer. | ||
Int. Cl. H03L 7/06 (2006.01) |
U.S. Cl. 327—159 | 12 Claims |
1. A die having an operating condition, the die comprising:
an output bus; and
a speed-locked loop to provide on the output bus a value indicative of the operating condition, the speed-locked loop comprising:
an oscillator having a frequency;
a counter to count cycles of the oscillator occurring throughout a counting time interval to provide a counter value indicative
of the oscillator frequency;
an input bus having a set of voltages representing an input bus value;
a comparator to compare the counter value to the input bus value; and
a control functional unit to decrease the oscillator frequency if the counter and input bus values satisfy a first relationship
and to increase the oscillator frequency if the counter and input bus values satisfy a second relationship,
wherein the set of voltages on the input bus is static during the counting time interval.
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