US 6,982,561 B2 | ||
Scattering parameter travelling-wave magnitude calibration system and method | ||
Jonathan B. Scott, Santa Rosa, Calif. (US) | ||
Assigned to Agilent Technologies, Inc., Palo Alto, Calif. (US) | ||
Filed on May 27, 2004, as Appl. No. 10/857,419. | ||
Prior Publication US 2005/0264301 A1, Dec. 01, 2005 | ||
Int. Cl. G01R 27/04 (2006.01); G01R 35/00 (2006.01) |
U.S. Cl. 324—638 | 26 Claims |
1. A method for determining magnitudes of travelling-waves at a non-coaxial plane of a scattering (S) parameter measurement
device, the S-parameter measurement device including an adapter link between the non-coaxial plane and a coaxial plane, the
method comprising:
conducting a calibration at an interface between the adapter link and the coaxial plane to derive coaxial error terms for
the S-parameter measurement device;
conducting a power meter measurement at the coaxial plane to obtain power wave measurements using the coaxial error terms;
conducting a calibration at an interface between the adapter link and the non-coaxial plane to derive non-coaxial error terms
for the S-parameter measurement device; and
calculating a magnitude of a select one of the travelling-waves at the non-coaxial plane using the coaxial error terms, the
power wave measurements and the non-coaxial error terms.
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