US 6,982,561 B2
Scattering parameter travelling-wave magnitude calibration system and method
Jonathan B. Scott, Santa Rosa, Calif. (US)
Assigned to Agilent Technologies, Inc., Palo Alto, Calif. (US)
Filed on May 27, 2004, as Appl. No. 10/857,419.
Prior Publication US 2005/0264301 A1, Dec. 01, 2005
Int. Cl. G01R 27/04 (2006.01); G01R 35/00 (2006.01)
U.S. Cl. 324—638 26 Claims
OG exemplary drawing
 
1. A method for determining magnitudes of travelling-waves at a non-coaxial plane of a scattering (S) parameter measurement device, the S-parameter measurement device including an adapter link between the non-coaxial plane and a coaxial plane, the method comprising:
conducting a calibration at an interface between the adapter link and the coaxial plane to derive coaxial error terms for the S-parameter measurement device;
conducting a power meter measurement at the coaxial plane to obtain power wave measurements using the coaxial error terms;
conducting a calibration at an interface between the adapter link and the non-coaxial plane to derive non-coaxial error terms for the S-parameter measurement device; and
calculating a magnitude of a select one of the travelling-waves at the non-coaxial plane using the coaxial error terms, the power wave measurements and the non-coaxial error terms.