US 6,982,569 B2
Multiple testing bars for testing liquid crystal display and method thereof
Sang-Kyoung Lee, Kyungki-do (Korea, Republic of); Dong-Gyu Kim, Kyungki-do (Korea, Republic of); and Min-Hyung Moon, Choongcheongnam-do (Korea, Republic of)
Assigned to Samsung Electronics Co., Ltd., Suwon (Korea, Republic of)
Filed on Nov. 13, 2003, as Appl. No. 10/705,836.
Application 10/705836 is a continuation of application No. 09/206317, filed on Dec. 07, 1998, granted, now 6,734,925.
Claims priority of application No. 97-66154 (KR), filed on Dec. 05, 1997; and application No. 98-49389 (KR), filed on Nov. 18, 1998.
Prior Publication US 2004/0124869 A1, Jul. 01, 2004
Int. Cl. G01R 31/00 (2006.01)
U.S. Cl. 324—770 9 Claims
OG exemplary drawing
 
1. A thin film panel, comprising:
a plurality of first wires transmitting first signals and extending in a direction substantially parallel to each other;
a plurality of second wires transmitting second signals and extending substantially parallel to the first wires;
a first testing bar connected to the first wires;
a second testing bar connected to the second wires and separated from the first testing bar, wherein the first and second testing bars are formed on a plane different from a plane on which the first and second wires are formed;
an insulating layer covering the first and second wires and the first and second testing bars and having a plurality of openings exposing the first and second wires and the first and second testing bars;
a plurality of first connecting members formed on the insulating layer and connecting the first wires to the first testing bar via the openings; and
a plurality of second connecting members formed on the insulating layer and connecting the second wires to the second testing bar via the openings.