US 6,982,566 B1 | ||
Method and apparatus for operating a burn-in board to achieve lower equilibrium temperature and to minimize thermal runaway | ||
Mohammed Alam, Milpitas, Calif. (US); and William Y. Hata, Saratoga, Calif. (US) | ||
Assigned to Altera Corporation, San Jose, Calif. (US) | ||
Filed on Apr. 01, 2004, as Appl. No. 10/816,773. | ||
Int. Cl. G01R 31/28 (2006.01) |
U.S. Cl. 324—760 | 27 Claims |
1. A method of burn-in testing an electronic device, comprising:
attaching the device to a burn-in board;
placing a first thermally conductive sheet atop the device such that the thermally conductive sheet contacts the device;
placing a second thermally conductive sheet beneath the burn-in board and separated therefrom by an electrically insulating
but thermally conductive sheet;
inserting the burn-in board with the device and the thermally conductive sheets into a chamber, wherein the environment within
the chamber is controllable;
applying current to the device; and
controlling the environment within the chamber.
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