US 6,983,207 B2 | ||
Machine component monitoring, diagnosing and selling system | ||
Yasuhiro Gotou, Tokyo (Japan); Hiroyuki Hakamata, Iwata (Japan); and Masataka Azuma, Tokyo (Japan) | ||
Assigned to NTN Corporation, Osaka (Japan) | ||
Filed on Jun. 15, 2001, as Appl. No. 9/880,931. | ||
Claims priority of application No. 2000-180890 (JP), filed on Jun. 16, 2000; and application No. 2000-255721 (JP), filed on Aug. 25, 2000. | ||
Prior Publication US 2002/0013635 A1, Jan. 31, 2002 | ||
Int. Cl. G01B 5/28 (2006.01) |
U.S. Cl. 702—35 | 47 Claims |
1. A machine component monitoring system monitoring machine components used in a machine system, a plurality of said machine
components each having rolling elements, said machine component monitoring system comprising:
a control unit;
a plurality of determining units, electrically connected, respectively, with a plurality of sensors, said determining units
being electrically connected with the control unit, each of the sensors being arranged on the respective machine component
and detecting an influence signal induced in the machine component and resulting from passage of the rolling elements, each
of the determining units determining, according to a predetermined process set-up condition, a status of the respective machine
component, said status being at least one of presence of an abnormality, absence of an abnormality, and lifetime of the respective
machine component, in reference to an output signal from the respective sensor; and
said control unit collecting results of determination performed by each of the determining units,
wherein when determining the status, each determining unit determines one of a presence of an abnormality and an absence of
an abnormality in a sensor waveform, which is the output signal from the associated sensor, and
each of the determining units determines whether a defect signal component contained in the sensor waveform deviates from
a predefined range, and in the event that the defect signal has been determined as deviating from the predefined range, determines
the presence of a defect waveform abnormality as the abnormality in the sensor waveform.
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