US 6,982,551 B2
Integrated circuit test device
Alan G. Yates, 12570 Mt. Hamilton Rd., San Jose, Calif. 95140 (US)
Filed on Jan. 26, 2004, as Appl. No. 10/764,807.
Prior Publication US 2005/0162152 A1, Jul. 28, 2005
Int. Cl. G01R 31/02 (2006.01)
U.S. Cl. 324—158.1 19 Claims
OG exemplary drawing
 
9. A device for testing integrated circuits comprising:
a base;
a socket within said base for receiving a plurality of terminals from an integrated circuit;
a lid;
a hinge joining said lid to said base;
a locking mechanism allowing locking of said lid to said base;
a pressure plate retained within said lid;
a means for lowering said pressure plate from said lid to said socket when said integrated circuit is placed within said socket, wherein said means includes a continuous circumferential inclined surface.