US 6,982,606 B2 | ||
Method and device for dynamically calibrating frequency | ||
Chun-Hsiung Chen, Hsinchu (Taiwan); and Sheng-Ho Wang, Sijhih (Taiwan) | ||
Assigned to Holtek Semiconductor Inc., Hsinchu (Taiwan) | ||
Filed on Apr. 06, 2004, as Appl. No. 10/818,815. | ||
Claims priority of application No. 92108484 (TW), filed on Apr. 11, 2003. | ||
Prior Publication US 2004/0201403 A1, Oct. 14, 2004 | ||
Int. Cl. H03L 1/00 (2006.01) |
U.S. Cl. 331—175 | 14 Claims |
1. A method for dynamically calibrating a frequency comprising steps of:
(a) providing a first system frequency;
(b) obtaining a first parameter of timer counting number;
(c) providing a second system frequency;
(d) obtaining a second parameter of timer counting number if there is a frequency drift between said first system frequency
and said second system frequency;
(e) obtaining a third parameter of timer interrupt interval by comparing said first parameter of timer counting number with
said second parameter of timer counting number; and
(f) calibrating a frequency output according to said third parameter of timer interrupt interval.
|