US 6,982,788 B2
Method and apparatus for spectrum analysis and encoder
Thomas W. Hagler, Pleasanton, Calif. (US)
Assigned to Aspectrics, Inc., Pleasanton, Calif. (US)
Filed on Jun. 04, 2004, as Appl. No. 10/861,816.
Application 09/846583 is a division of application No. 09/105279, filed on Jun. 26, 1998, granted, now 6,271,917.
Application 10/861816 is a continuation of application No. 10/062607, filed on Feb. 01, 2002, granted, now 6,762,833.
Application 10/062607 is a continuation of application No. 09/846583, filed on May 01, 2001, granted, now 6,388,794.
Prior Publication US 2004/0223150 A1, Nov. 11, 2004
Int. Cl. G01J 3/04 (2006.01); G01J 3/133 (2006.01)
U.S. Cl. 356—310 6 Claims
OG exemplary drawing
 
1. An radiation spectrum analyzer comprising:
a source providing radiation of a plurality of selected wavelength components;
first means for collecting and focusing a beam of radiation from the source to form an elongated image dispersed by wavelength along a length of the image onto a plane, a two dimensional spatial light modulator rotated about an axis and positioned in said plane so that said image is dispersed along a radial direction, said modulator having dispersed radiation filters at different radii from said axis, said filters modulating the amplitudes of said wavelength components to provide encoded components, wherein said amplitudes of the encoded components changes between three or more distinct levels of contrast when the modulator is rotated about the axis;
a detector,
second means for collecting and directing said encoded beam onto said detector; and
means for analyzing signals generated by said detector in response to the encoded beam.