US 6,982,551 B2 | ||
Integrated circuit test device | ||
Alan G. Yates, 12570 Mt. Hamilton Rd., San Jose, Calif. 95140 (US) | ||
Filed on Jan. 26, 2004, as Appl. No. 10/764,807. | ||
Prior Publication US 2005/0162152 A1, Jul. 28, 2005 | ||
Int. Cl. G01R 31/02 (2006.01) |
U.S. Cl. 324—158.1 | 19 Claims |
9. A device for testing integrated circuits comprising:
a base;
a socket within said base for receiving a plurality of terminals from an integrated circuit;
a lid;
a hinge joining said lid to said base;
a locking mechanism allowing locking of said lid to said base;
a pressure plate retained within said lid;
a means for lowering said pressure plate from said lid to said socket when said integrated circuit is placed within said socket,
wherein said means includes a continuous circumferential inclined surface.
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