US 7,321,999 B2 | ||
Methods and apparatus for programming and operating automated test equipment | ||
Domenico Chindamo, Rome (Italy); and Ariadne Salagianis, Bethlehem, Pa. (US) | ||
Assigned to Verigy (Singapore) Pte. Ltd., Singapore (Singapore) | ||
Filed on Oct. 05, 2004, as Appl. No. 10/959,857. | ||
Prior Publication US 2006/0075317 A1, Apr. 06, 2006 | ||
Int. Cl. G01R 31/28 (2006.01) |
U.S. Cl. 714—726 | 13 Claims |
1. A method for testing an electronic device using automated test equipment (ATE), comprising:
storing different vectors of scan load data in memory of the ATE;
storing a scan unload subroutine in the memory;
stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic
device; and
capturing responses to the different vectors by i) repeatedly calling the scan unload subroutine, and in response thereto,
ii) storing different vectors of scan unload data in the memory.
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