US 7,321,116 B2 | ||
Ionization source for mass spectrometer | ||
Pierre Picard, Québec (Canada); Denis Lessard, Lévis (Canada); André L'Heureux, Lévis (Canada); Jean Lacoursiere, Sillery (Canada); Philippe Nobert, Québec (Canada); Sylvain Letarte, Blainville (Canada); Alexandre Vallieres, Sainte-Foy (Canada); Robert Tiveron, Stoneham (Canada); and Réal Paquin, Sainte-Foy (Canada) | ||
Assigned to Phytronix Technologies, Inc., Quebec (Canada) | ||
Filed on May 20, 2005, as Appl. No. 11/133,896. | ||
Claims priority of application No. 2,480,549 (CA), filed on Sep. 15, 2004. | ||
Prior Publication US 2006/0054807 A1, Mar. 16, 2006 | ||
Int. Cl. H01J 49/04 (2006.01) |
U.S. Cl. 250—288 [250/287] | 45 Claims |
1. An apparatus for generating an ionized sample, said apparatus comprising:
a heat conductive support adapted to load a source sample thereon, said support having a sample-receiving side and a heat-receiving
side;
heating means for heating said heat-receiving side of said support to cause heating through the support toward the sample-receiving
side thereof, to cause heating of the source sample, thereby producing a desorbed sample through desorption of the source
sample;
a transfer tube having a first end and a second end, said desorbed sample being received at the first end, said transfer tube
being provided with a carrier gas flow therethrough carrying said desorbed sample from the first end to said second end; and
ionizing means provided proximate the second end of the transfer tube for ionizing said desorbed sample to thereby obtain
said ionized sample.
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