US 7,321,234 B2
Resistive test probe tips and applications therefor
Julie A. Campbell, Beaverton, Oreg. (US); and Lawrence W. Jacobs, Beaverton, Oreg. (US)
Assigned to LeCroy Corporation, Chesnut Ridge, N.Y. (US)
Filed on Mar. 19, 2007, as Appl. No. 11/725,736.
Application 11/725736 is a continuation in part of application No. 11/018133, filed on Dec. 17, 2004, granted, now 7,202,678.
Application 11/725736 is a continuation in part of application No. 11/725736.
Application 11/725736 is a continuation in part of application No. 11/352128, filed on Feb. 10, 2006, granted, now 7,262,614.
Claims priority of provisional application 60/652046, filed on Feb. 10, 2005.
Claims priority of provisional application 60/531076, filed on Dec. 18, 2003.
Prior Publication US 2007/0229099 A1, Oct. 04, 2007
Int. Cl. G01R 31/02 (2006.01)
U.S. Cl. 324—754 18 Claims
OG exemplary drawing
 
1. A test probe tip or contact comprising:
(a) resistive material having a resistance described by the equation R1=0.75×(√(L1/(C1×Length)) where R1 is the resistance, L1 is the inductance, and C1 is the capacitance per millimeter;
(b) said test probe tip or contact constructed substantially from said resistive material, said test probe tip comprising:
(i) a probing end for probing electronic circuitry; and
(ii) a connection end for interfacing with a probing head; and
(c) said resistive material forming at least one electrical path from said probing end to said connection end.