US 7,321,999 B2
Methods and apparatus for programming and operating automated test equipment
Domenico Chindamo, Rome (Italy); and Ariadne Salagianis, Bethlehem, Pa. (US)
Assigned to Verigy (Singapore) Pte. Ltd., Singapore (Singapore)
Filed on Oct. 05, 2004, as Appl. No. 10/959,857.
Prior Publication US 2006/0075317 A1, Apr. 06, 2006
Int. Cl. G01R 31/28 (2006.01)
U.S. Cl. 714—726 13 Claims
OG exemplary drawing
 
1. A method for testing an electronic device using automated test equipment (ATE), comprising:
storing different vectors of scan load data in memory of the ATE;
storing a scan unload subroutine in the memory;
stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and
capturing responses to the different vectors by i) repeatedly calling the scan unload subroutine, and in response thereto, ii) storing different vectors of scan unload data in the memory.