US 7,321,233 B2
System for evaluating probing networks
Eric W. Strid, Portland, Oreg. (US); Jerry B. Schappacher, Portland, Oreg. (US); Dale E. Carlton, Portland, Oreg. (US); and K. Reed Gleason, Portland, Oreg. (US)
Assigned to Cascade Microtech, Inc., Beaverton, Oreg. (US)
Filed on Jan. 11, 2007, as Appl. No. 11/652,788.
Application 08/866165 is a division of application No. 08/669097, filed on Jun. 26, 1996, granted, now 5,659,255, filed on Aug. 19, 1997.
Application 08/669097 is a division of application No. 08/422439, filed on Apr. 14, 1995, granted, now 5,561,377, filed on Oct. 01, 1996.
Application 11/652788 is a continuation of application No. 11/298799, filed on Dec. 09, 2005, granted, now 7,164,279.
Application 11/298799 is a continuation of application No. 10/951917, filed on Sep. 28, 2004, granted, now 6,987,398.
Application 10/951917 is a continuation of application No. 10/459259, filed on Jun. 11, 2003, granted, now 6,803,779.
Application 10/459259 is a continuation of application No. 09/611806, filed on Jul. 07, 2000, granted, now 6,608,496, filed on Aug. 19, 2003.
Application 09/611806 is a continuation of application No. 09/359989, filed on Jul. 22, 1999, granted, now 6,130,544, filed on Oct. 10, 2000.
Application 09/359989 is a continuation of application No. 09/175062, filed on Oct. 19, 1998, granted, now 5,973,505, filed on Oct. 26, 1999.
Application 09/175062 is a continuation of application No. 08/866165, filed on May 30, 1997, granted, now 5,869,975, filed on Feb. 09, 1999.
Prior Publication US 2007/0109001 A1, May 17, 2007
Int. Cl. G01R 31/26 (2006.01)
U.S. Cl. 324—754  [324/73.1] 17 Claims
OG exemplary drawing
 
1. An assembly for use in evaluating signal conditions in a probe measurement network, said probe measurement network being of the type having spaced-apart first and second device-probing ends, said assembly comprising:
(a) a base having an upper face including a dielectric area;
(b) respective first and second conductive probing areas located on said upper face in spaced-apart relationship to each other, said first and second conductive probing areas being insulated from each other by said dielectric area and arranged so that said first and second device-probing ends can be simultaneously placed on said first and second conductive probing areas, respectively;
(c) a reference junction; and
(d) a high-frequency transmission structure connecting said first and second conductive probing areas to said reference junction, said transmission structure including an inner conductor and an outer conductor separated by an inner dielectric, said inner conductor being connected to one of said first and second conductive probing areas and said outer conductor being connected to the other of said first and second conductive probing areas.