US 7,320,910 B2
Semiconductor device
Motoi Ashida, Hyogo (Japan)
Assigned to Renesas Technology Corp., Tokyo (Japan)
Filed on Nov. 20, 2006, as Appl. No. 11/601,701.
Application 11/601701 is a continuation of application No. 10/724618, filed on Dec. 02, 2003, granted, now 7,145,205.
Claims priority of application No. 2003-137228 (JP), filed on May 15, 2003.
Prior Publication US 2007/0067601 A1, Mar. 22, 2007
Int. Cl. H01L 21/8238 (2006.01)
U.S. Cl. 438—199  [438/218; 438/655; 257/E21.409] 4 Claims
OG exemplary drawing
 
1. A method of manufacturing a semiconductor device, said semiconductor device comprising:
a semiconductor substrate having two types of active regions that are a PMOS and an NMOS region separated from each other in plan view by a PN separation film;
a first gate electrode of P-type polycrystal silicon extending across said PMOS region and extending over said PN separation film;
first source and drain regions formed in said PMOS region at both sides of said first gate electrode;
a second gate electrode of N-type polycrystal silicon extending across said NMOS region and extending over said PN separation film;
second source and drain regions formed in said NMOS region at both sides of said second gate electrode;
a first insulating film formed over said first gate electrode in said PMOS region;
a second insulating film formed over said second gate electrode in said NMOS region;
a first sidewall insulating film formed on a side surface of said first gate electrode and said first insulating film;
a second sidewall insulating film formed on a side surface of said second gate electrode and said second insulating film;
a silicide film formed over said PN separation film and having a first side contacting said first gate electrode and a second side contacting said second gate electrode;
an interlayer insulating film formed over said first gate electrode, said first insulating film, and said first source and drain regions, and said interlayer insulating film having a contact hole overlapping one of said second source and drain regions and said second gate electrode in plan view; and
a conductive material filled in said contact hole and electrically connected to said one of second source and drain regions,
wherein said first and second sides of said silicide film are within said PN separation film in plan view and said first and second sides of said silicide film do not extend to said two types of active regions, and
wherein said interlayer insulating film covers a whole surface of said silicide film; comprising the steps of:
forming, at a main surface of a semiconductor substrate, active regions including a PMOS region and an NMOS region separated from each other by a PN separation film;
forming a polysilicon layer at the main surface of said semiconductor substrate, with a first insulating film to serve as a gate insulating film interposed therebetween;
forming a second insulating film on a surface of said polysilicon layer, in a gate electrode forming region extending from said PMOS region to said NMOS region across said PN separation film;
patterning said polysilicon layer with said second insulating film serving as a mask, and forming a first gate electrode extending from a surface of said PMOS region to said PN separation film and a second gate electrode extending from said NMOS region to said PN separation film and connecting to said first gate electrode;
forming, at the main surface of said semiconductor substrate, a first source region and a first drain region opposed to each other by allowing said first gate electrode to be placed therebetween in a plan view;
forming, at the main surface of said semiconductor substrate, a second source region and a second drain region opposed to each other by allowing said second gate electrode to be placed therebetween in a plan view;
patterning said second insulating film, covering said first and second gate electrodes on said active regions, and exposing said first and second gate electrodes on said PN separation film; and
silicidizing said first and second gate electrodes exposed from said second insulating film.