US 12,169,210 B2
Probe tip with rigid frame and flexible tip portion
Nicholas Fernandez, Colorado Springs, CO (US); and Ashley Yang, Colorado Springs, CO (US)
Assigned to KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US)
Filed by Keysight Technologies, Inc., Santa Rosa, CA (US)
Filed on Feb. 14, 2023, as Appl. No. 18/109,299.
Prior Publication US 2024/0272199 A1, Aug. 15, 2024
Int. Cl. G01R 1/067 (2006.01); G01R 31/28 (2006.01)
CPC G01R 1/06788 (2013.01) [G01R 1/06738 (2013.01); G01R 1/06772 (2013.01); G01R 31/2889 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A probe tip for connecting a test instrument to a device under test (DUT), the probe tip comprising:
a rigid frame configured to attach to a stable base, wherein the stable base is configured to provide stability during a testing and measuring operation;
a connector assembly attached to or integrated with the rigid frame; and
a flexible tip portion removably connected at a proximal end to the connector assembly, wherein the flexible tip portion comprises a plurality of DUT contacts at a distal end and a plurality of electrical leads respectively connected to the plurality of DUT contacts.