US 12,168,343 B2
Recording device and recording method for recording device
Shinya Yamazaki, Higashichikuma-Gun Asahi-Mura (JP)
Assigned to Seiko Epson Corporation, Tokyo (JP)
Filed by SEIKO EPSON CORPORATION, Tokyo (JP)
Filed on Aug. 30, 2022, as Appl. No. 17/823,137.
Claims priority of application No. 2021-140970 (JP), filed on Aug. 31, 2021.
Prior Publication US 2023/0068296 A1, Mar. 2, 2023
Int. Cl. B41J 11/00 (2006.01); B41J 2/12 (2006.01); B41J 13/10 (2006.01); B65H 5/06 (2006.01)
CPC B41J 11/0015 (2013.01) [B41J 2/12 (2013.01); B41J 13/10 (2013.01); B65H 5/062 (2013.01); B41J 2203/01 (2020.08)] 10 Claims
OG exemplary drawing
 
1. A recording device, comprising:
a recorder configured to apply a liquid droplet to a recording medium to record an image;
a transporter configured to transport the recording medium in a transport direction via a region facing the recorder;
a supporter configured to support the recording medium in the region facing the recorder;
a heater configured to heat the recording medium supported by the supporter; and
a controller configured to control the recorder, the transporter, and the heater,
wherein the controller causes the heater to heat, at a predetermined and constant heating temperature, the recording medium supported by the supporter, and causes the recorder and the transporter to record, on the recording medium as a test pattern, a first test pattern of a predetermined recording density, a second test pattern of a recording density different from the predetermined recording density, and a third test pattern of a recording density different from the predetermined recording density, the recording density of the first test pattern, the recording density of the second test pattern, and the recording density of the third test pattern are settable in the heater, and are associated with heating temperatures different from each other, and
wherein the controller records, on the recording medium, as the test pattern, the first test pattern, the second test pattern, and the third test pattern, and the first test pattern is the test pattern having a higher recording density associated with a lower heating temperature than the second test pattern, and is the test pattern having a lower recording density associated with a higher heating temperature than the third test pattern.