CPC G01R 1/06788 (2013.01) [G01R 1/06738 (2013.01); G01R 1/06772 (2013.01); G01R 31/2889 (2013.01)] | 20 Claims |
1. A probe tip for connecting a test instrument to a device under test (DUT), the probe tip comprising:
a rigid frame configured to attach to a stable base, wherein the stable base is configured to provide stability during a testing and measuring operation;
a connector assembly attached to or integrated with the rigid frame; and
a flexible tip portion removably connected at a proximal end to the connector assembly, wherein the flexible tip portion comprises a plurality of DUT contacts at a distal end and a plurality of electrical leads respectively connected to the plurality of DUT contacts.
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