US 12,170,124 B2
Scan-based voltage frequency scaling
Leon Zlotnik, Camino, CA (US); Leonid Minz, Beer Sheva (IL); and Yoav Weinberg, Thornhill (CA)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Mar. 11, 2022, as Appl. No. 17/692,262.
Prior Publication US 2023/0290426 A1, Sep. 14, 2023
Int. Cl. G11C 29/50 (2006.01); G11C 29/02 (2006.01)
CPC G11C 29/50004 (2013.01) [G11C 29/028 (2013.01)] 23 Claims
OG exemplary drawing
 
1. A method comprising:
performing a plurality of at-speed fault detection scan operations of a memory system at a respective plurality of voltage values, wherein each of the plurality of at-speed fault detection scan operations captures timing errors at an elevated frequency value or a lowered voltage value than scan operations performed not at-speed;
causing data gathered from each of the plurality of at-speed fault detection scan operations to be entered into a database, wherein the entered data is associated with the plurality of voltage values;
determining a particular voltage value of the respective plurality of voltage values at which a parameter of the memory system reaches an error quantity or rate threshold; and
indicating the determined particular voltage in the database to be used for performing one or more operations using the memory system.