US 12,169,220 B2
Integrated circuit spike check probing apparatus and method
William Joshua Bush, Sunnyvale, CA (US); Neeraj Bhardwaj, Bangalore (IN); Erfan Shirazian, Fort Worth, TX (US); Madhusudan Sampath, Bangalore (IN); James Scott Mason, Tucson, AZ (US); Yazdi Contractor, Tucson, AZ (US); and Pavinkumar Ramasamy, Bangalore (IN)
Assigned to TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Jul. 26, 2019, as Appl. No. 16/523,720.
Claims priority of provisional application 62/703,707, filed on Jul. 26, 2018.
Prior Publication US 2020/0033403 A1, Jan. 30, 2020
Int. Cl. G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01)
CPC G01R 31/287 (2013.01) [G01R 1/06705 (2013.01); G01R 1/07364 (2013.01); G01R 31/2886 (2013.01); G01R 31/2887 (2013.01); G01R 31/2893 (2013.01)] 25 Claims
OG exemplary drawing
 
1. Apparatus for cooperating with a stationary integrated circuit test board, comprising:
a spatially adjustable frame for positioning relative to the stationary integrated circuit test board, the stationary integrated circuit test board for coupling to an integrated circuit device under test via an interface contactor;
a probe having a probe tip; and
a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the stationary integrated circuit test board.