US 12,169,189 B2
Structure evaluation system, structure evaluation apparatus, and structure evaluation method
Hidefumi Takamine, Shinagawa (JP); Yuki Ueda, Kawasaki (JP); Kazuo Watabe, Yokohama (JP); and Tomoki Shiotani, Kyoto (JP)
Assigned to Kabushiki Kaisha Toshiba, Tokyo (JP); and Kyoto University, Kyoto (JP)
Filed by Kabushiki Kaisha Toshiba, Tokyo (JP); and Kyoto University, Kyoto (JP)
Filed on Mar. 4, 2022, as Appl. No. 17/653,512.
Application 17/653,512 is a continuation of application No. PCT/JP2020/027652, filed on Jul. 16, 2020.
Prior Publication US 2022/0187253 A1, Jun. 16, 2022
Int. Cl. G01N 29/44 (2006.01); G01N 29/04 (2006.01); G01N 29/34 (2006.01)
CPC G01N 29/4445 (2013.01) [G01N 29/043 (2013.01); G01N 29/045 (2013.01); G01N 29/341 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A structure evaluation system comprising:
a plurality of sensors configured to detect elastic waves generated from a structure;
a position locator configured to locate a position of a generation sources of a plurality of elastic waves based on the plurality of elastic waves detected by the plurality of sensors;
a corrector configured to correct information based on the position locating performed by the position locator using a correction value set in correspondence with an impact; and
an evaluator configured to evaluate a deterioration state of the structure based on the corrected information.